Negative Ion Control for Dielectric Etch

ABSTRACT

Apparatus, methods, and computer programs for semiconductor processing in a capacitively-coupled plasma chamber are provided. A chamber includes a bottom radio frequency (RF) signal generator, a top RF signal generator, and an RF phase controller. The bottom RF signal generator is coupled to the bottom electrode in the chamber, and the top RF signal generator is coupled to the top electrode. Further, the bottom RF signal is set at a first phase, and the top RF signal is set at a second phase. The RF phase controller is operable to receive the bottom RF signal and operable to set the value of the second phase. Additionally, the RF phase controller is operable to track the first phase and the second phase to maintain a time difference between the maximum of the top RF signal and the minimum of the bottom RF signal at approximately a predetermined constant value, resulting in an increase of the negative ion flux to the surface of the wafer.

BACKGROUND

1. Field of the Invention

The present invention relates to methods, systems, and computer programsfor facilitating dielectric etching of a semiconductor device, and moreparticularly, methods, systems, and computer programs for facilitatingnegative ion control in a capacitively-coupled plasma (CCP) chamber.

2. Description of the Related Art

The manufacturing of integrated circuits includes immersing siliconsubstrates (wafers) containing regions of doped silicon intochemically-reactive plasmas, where the submicron device features (e.g.,transistors, capacitors, etc.) are etched onto the surface. Once thefirst layer is manufactured, several back-end insulating (dielectric)layers are built on top of the first layer, where holes (also referredto as vias) and trenches are etched into the material for placement ofthe conducting interconnectors.

SiO₂ is a common dielectric used in semiconductor manufacturing. Theplasmas used for SiO₂ etching often include fluorocarbon gases such ascarbon tetrafluoride CF₄ and otafluorocyclobutane (C—C₄F₈), along withargon (Ar) and oxygen (O₂) gases. The word plasma is used to refer tothose gases in which the constituent atoms and molecules have beenpartially or wholly ionized. Capacitive radio frequency (RF) powercoupling is often used for striking and sustaining the plasma because ofthe low dissociation rates obtained, favoring larger passivatingmolecules and high ion energies at the surface. To obtain independentcontrol of the ion energy and the ion flux to the silicon substrate,dual frequency capacitive discharges (DF-CCP) are sometimes used.

Etching of the wafer is often performed by positive ions when thepositive ions escape from the plasma and strike the feature to beetched. Some etching methods also rely on negative-ion etching bypulsing the plasma, i.e. having periods were the RF power supply isturned off, which enables the escaping of negative ions from the plasmaduring the off period of the RF (also referred to as the afterglow).However, pulsing the RF power supply is not an efficient way of etching,because the plasma is being created and dissipated in each cycle.

It is in this context that embodiments arise.

SUMMARY

Embodiments of the present invention provide methods, systems, andcomputer programs for negative ion control in a capacitively-coupledplasma chamber. Embodiments enable the flux of both positive andnegative ions to the surface of the wafer for feature-charging control.

It should be appreciated that the present invention can be implementedin numerous ways, such as a process, an apparatus, a system, a device ora method on a computer readable medium. Several inventive embodiments ofthe present invention are described below.

In one embodiment, a capacitively-coupled plasma chamber is provided.The chamber includes a bottom radio frequency (RF) signal generator, atop RF signal generator, and an RF phase controller. The bottom RFsignal generator is coupled to the bottom electrode in the chamber, andthe top RF signal generator is coupled to the top electrode. Further,the bottom RF signal is set at a first phase, and the top RF signal isset at a second phase. The RF phase controller is operable to receivethe bottom RF signal and operable to set the value of the second phase.Additionally, the RF phase controller is operable to track the firstphase and the second phase to maintain a time difference between themaximum of the top RF signal and the minimum of the bottom RF signal atapproximately a predetermined constant value.

In another embodiment, a method for operating a capacitively-coupledplasma chamber is presented. The method includes operations for applyinga bottom radio frequency (RF) signal set at a first phase to a bottomelectrode in the chamber, and for measuring the first phase of thebottom RF signal. Further, the method includes an operation for applyinga top RF signal set at a second phase to a top electrode in the chamber.The first phase and the second phase are tracked to maintain a timedifference between a maximum of the top RF signal and a minimum of thebottom RF signal at approximately a constant predetermined value.

In yet another embodiment, a capacitively-coupled plasma chamberincludes a bottom radio frequency (RF) signal generator coupled to abottom electrode, and an RF phase controller. The bottom RF signal isset at a first phase, and the RF phase controller is operable to receivethe bottom RF signal. Further, the RF phase controller is operable togenerate a top RF signal set at a second phase for a top electrode. TheRF phase controller is operable to track the first phase and the secondphase to maintain a time difference between a maximum of the top RFsignal and a minimum of the bottom RF signal at a predetermined value.

Other aspects will become apparent from the following detaileddescription, taken in conjunction with the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

The invention may best be understood by reference to the followingdescription taken in conjunction with the accompanying drawings.

FIG. 1 shows an asymmetric etching chamber, according to one embodiment.

FIG. 2 shows the plasma and wafer potentials over time, according to oneembodiment.

FIG. 3 illustrates the electrode and plasma potential for the chamber ofFIG. 1, according to one embodiment.

FIG. 4 shows a capacitively-coupled plasma (CCP) chamber with negativeion control, according to one embodiment.

FIGS. 5A and 5B illustrate embodiments of CCP chambers with negative ioncontrol.

FIGS. 6A-6E illustrate the operation of the etching chamber at differenttimes in the RF power cycle, according to one embodiment.

FIG. 7 show measurements of the wafer sheath potential in a dualfrequency chamber, according to one embodiment.

FIG. 8 shows a flowchart illustrating an algorithm for adjusting thephase of the top-electrode RF signal in relation to the phase of thebottom-electrode RF signal.

FIG. 9 shows a flowchart illustrating an algorithm for negative ioncontrol in a capacitively-coupled plasma chamber, in accordance with oneembodiment of the invention.

FIG. 10 is a simplified schematic diagram of a computer system forimplementing embodiments of the present invention.

DETAILED DESCRIPTION

Embodiments of the invention perform substrate etching utilizingnegative ions. The top electrode is powered with a low frequency radiofrequency (RF) whose is phase is controlled based on the phase ofanother low frequency RF applied to the bottom electrode. Negative ionsborn at the top sheath travel through the plasma bulk, and approach thewafer surface when the bottom sheath potential is approximately at aminimum.

It will be apparent, that the present embodiments may be practicedwithout some or all of these specific details. In other instances, wellknown process operations have not been described in detail in order notto unnecessarily obscure the present embodiments.

FIG. 1 shows an asymmetric etching chamber, according to one embodiment.Exciting an electric field between two electrodes is one of the methodsto obtain RF gas discharge in an etching chamber. When an oscillatingvoltage is applied between the electrodes, the discharge obtained isreferred to as a capacitive coupled plasma (CCP) discharge.

Plasma can be created utilizing stable feedstock gases to obtain a widevariety of chemically reactive by-products created by the dissociationof the various molecules caused by electron-neutral collisions. Thechemical aspect of etching involves the reaction of the neutral gasmolecules and their dissociated by-products with the molecules of theto-be-etched surface, and producing volatile molecules, which can bepumped away. When plasma is created, the positive ions are acceleratedfrom the plasma across a space-charge sheath separating the plasma fromthe walls, to strike the wafer surface with enough energy to removematerial from the surface of the wafer. This is known as ion bombardmentor ion sputtering. Some industrial plasmas, however, do not produce ionswith enough energy to efficiently etch a surface by purely physicalmeans. It has been proven that that the combined actions of bothneutral-gas etching and ion bombardment produces a faster etch rate thansimply adding the effects of each method.

In one embodiment, Fluorocarbon gases, such as CF₄ and C—C₄F₈, are usedin the dielectric etch process for their anisotropic and selectiveetching capabilities, but the principles of the invention can be appliedto other plasma-creating gases. The Fluorocarbon gases are readilydissociated into smaller molecular and atomic radicals. These chemicallyreactive by-products etch away the dielectric material, which in oneembodiment can be SiO₂ or SiOCH for low-k devices.

FIG. 1 illustrates an asymmetric chamber with top electrode 102, plasma104 that is created during the operation of the chamber, and bottomelectrode 106. In this embodiment, the top electrode 102 is connected toground, and the bottom electrode 106 is connected to RF power supply 108via RF match 109. The substrate, or wafer 107 is placed on bottomelectrode 106. The top sheath is larger than the bottom sheath, becauseof the geometrical asymmetry in the size of the electrodes, i.e., topelectrode 102 is bigger than bottom electrode 106.

FIG. 2 shows the plasma and wafer potentials over time, according to oneembodiment. In a typical symmetric system, electrodes have the same sizeand the wafer DC bias is 0 V. When the area of top electrode isincreased, an asymmetry is created in the plasma. The sheath at thewafer is increased, resulting in higher ion energies at the wafer. Thewear rate of the grounded parts facing the plasma is reduced due to thelower plasma potential, which causes lower ion bombardment energies atthe grounded surface.

Fluorocarbons, being halogen derived gases, can produce significantquantities of negative ions. For more information on the production ofnegative ions, please refer to Thin Solid Films, Kono et al, 2002, p.198-203, which is herein incorporated by reference. The presence ofnegative ions can modify the plasma structure and result in a reductionof the positive ion flux leaving the plasma.

However, if the negative ions are capable of reaching the substrate,then the negative ions may also participate in the etching process.

FIG. 2 shows a chart for the voltages of the chamber in FIG. 1. Thevoltage at the wafer corresponds to the RF signal generated at thebottom electrode, which has a negative DC bias voltage V_(bias). Theplasma potential is positive with respect to ground and follows theshape of the voltage at the wafer, except that the plasma potential hasa flat-bottom shape due to the asymmetry of the chamber.

FIG. 3 illustrates the electrode and plasma potential for the chamber ofFIG. 1, according to one embodiment. In the CCP chamber, the capacitancecreated is not between the electrodes directly, but rather between theelectrodes and the plasma, i.e. across the sheaths. The sheaths are, toa good approximation, electron free and act as potential barriers forplasma negative species, such as electrons and negative ions, allowingonly ion and RF displacement currents to pass.

As a consequence of sheath formation, the plasma 304 is at a positivepotential with respect to ground. As the sheath is a layer of chargeseparation, the ions entering this space charge region must gain enoughenergy to break free from the quasi-neutral plasma. In the chamber ofFIG. 3, the top electrode 306 is at ground potential, the plasma is at apositive potential V_(p), and the bottom electrode 302 has a DC biaswith negative potential −V_(DC).

FIG. 4 shows a capacitively-coupled plasma (CCP) chamber with negativeion control, according to one embodiment. One characteristic of plasmaetching is the ability to etch anisotropically, that is, in a singledirection. This is the result of the synergy between the ions and thesurface chemistry. As the ions are accelerated by a uni-directionalelectric field across the sheath, the direction of the ions on impact isprimarily perpendicular to the surface. If the surface to be etched iscovered with a patterned mask (e.g., photoresist), the areas unprotectedby the mask will be etched in a mainly vertical direction.

Negative ions play a significant role in surface charge control and theetch rate in dielectric etch processes. In a typical asymmetriccapacitive discharge, negative ions do not usually reach the surface ofthe wafer since they are trapped in the plasma bulk by the sheathpotential. Low energy negative ions born in the plasma bulk cannotescape from plasma, but high energy negative ions generated at expandingsheaths can cross the plasma bulk and reach the surface of the oppositeelectrode. For more information, please refer to Journal of AppliedPhysics Volume 79 (12), Zeuner at al., 15 Jun. 1996, p. 9379, which isherein incorporated by reference. In asymmetrical discharge, negativeions born at high voltage (powered electrode) sheath can escape to thelower voltage grounded upper electrode.

Some existing methods utilize a pulsing RF power source. When plasma isin the off period (referred to as the afterglow), the negative iondensity increases due to low temperature electron attachment toneutrals. The negative ions escape to the walls and neutralize positivecharges that may be have accumulated on the walls during the RF onperiod. However, by pulsing the RF, the overall flux of positive ions tothe substrate drops, resulting in slower etch rates.

In a single high frequency (e.g., 60 MHz) plasma with relatively lowsheath potentials, negative ions cannot escape from the plasma to thesmaller-area powered electrode. However, in a dual frequency chamberwith high and low frequency RF sources (e.g, 27 MHz and 2 MHz) somenegative ions escape the plasma bulk due to higher sheath potentials.For more information, please refer to Journal of Applied Physics Volume94 (6), Georgieva et al., 15 Sep. 2003, p. 3748, which is hereinincorporated by reference. The motivation for dual frequency sources isthe independent control of the ion flux and the ion energy. The highfrequency source controls the ion flux, and the low frequency sourcecontrols the ion energy. Embodiments of the invention increase thenumber of negative ions that reach the wafer for processing.

FIG. 4 shows a semiconductor manufacturing tool 402 with acapacitively-coupled, parallel-plate chamber 410. The bottom electrode418 is powered by a high frequency RF power generator 422 trough RFmatch 423, and by a low frequency RF power generator 424 trough RF match425. Wafer 416 is disposed above bottom electrode 418 during processing.The top electrode 406 is powered by a low frequency RF power generator404 through RF match 405. In one embodiment, a 32 mm gap separates bothelectrodes, but other gap values are also possible, such as valuesbetween 15 mm and 100 mm, or more. In one embodiment, the low frequencyis 2MHz and the high frequency is 27 MHz, but other values are alsopossible. For example, the low frequency can be any frequency in therange from 0.2 MHz to 2 MHz, and the high frequency can be any frequencyin the range from 10 MHz to 100 MHz.

The semiconductor manufacturing tool 402 also includes an RF phasecontroller 412 that controls the phases of low frequency RF generators404 and 424. As described in more detail below with reference to FIGS.6A to 6D, the low frequencies generated at the top and bottom electrodehave a phase difference that is controlled by RF phase controller 412.In one embodiment, RF phase controller 412 tracks the phase of RFgenerator 424 and determines the desired phase for the RF generator 404at the top electrode 406. Once the phase for the RF generator 404 istracked, RF phase controller 412 generates a signal to set the phase ofRF power source 404 to the desired phase. This way, the phase differencebetween the low RF power generators is controlled and set to the desiredvalue. It is referred to herein as having the phase of one signaltracked to the phase of the other signal when the phase of one signal isbased on the phase of the other signal, but both signals are notrequired to be synchronously at the same phase. In other words, themaximum value for one of the signals follows a predetermined amount oftime from the maximum of the other signal. More specifically, asdescribed in detail below, the minimum value of one signal follows apredetermined amount of time after the maximum of the other signal.

In other embodiment, RF phase controller reads the phase of thefrequency generated at RF generator 404 and sends a control signal tocontrol the phase of RF generator 424. In yet another embodiment, RFphase controller 412 controls both RF generator 404 and RF generator 424so the desired phase difference is achieved by the system.

The system interface 420 provides an interface to access and controlmodules of the semiconductor manufacturing tool 402. The systeminterface includes connections to facilities 414, such as networking,gas sources, gas exhausts, vacuum, temperature control, etc. In oneembodiment, system interface is configured via a recipe 426, whichincludes the chamber's parameters settings for the operation of thechamber, such as temperature, pressure, power levels for the top andbottom electrodes, chemistry flow rate, timing, facility interface, etc.Recipe 426 also includes information for configuring the RF phasecontroller 412, including the desired phase difference between the lowfrequencies generated at the top and bottom electrodes.

FIGS. 5A and 5B illustrate embodiments of capacitively-coupled plasmachambers with negative ion control. The chamber of FIG. 5A includes atop electrode powered by low-frequency RF generator 502, and a bottomelectrode powered by low-frequency RF generator 520 and high-frequencyRF generator 518. The top electrode RF generator 502 is connected tomatching network 504. The bottom electrode is connected, via matchingnetwork 516, to the low-frequency RF generator 520 and to thehigh-frequency RF generator 518. RF phase controller 514 receives theoutput from the matching network 516, and analyzes the phase of the lowfrequency generated. Based on the phase of the low-frequency generatedat the bottom electrode, RF phase controller 514 adjusts the phase of RFgenerator 502 at the top electrode, such that the low frequenciesgenerated at the top and the bottom electrodes have the desired phasedifference.

The chamber of FIG. 5A includes a gas showerhead on the top electrode toinput gas in the chamber, and a perforated confinement ring 524 thatallows the gas to be pumped out from the chamber. When substrate 512 ispresent in the chamber, dielectric focus ring 522 is situated next tothe substrate such that there is a continuous surface below the plasma508 for uniform etching on the surface of the wafer.

The embodiment of FIG. 5B is similar to the embodiment of FIG. 5A,except the there is only one low frequency RF generator in the chamberof FIG. 5B. To provide the low-frequency RF to the top electrode, a highvoltage probe 517 is connected to the output of the matching network516. In this embodiment, the high frequency filter 524 filters out thehigh frequency signal (27 MHz) generated by the high frequency RFgenerator.

RF phase and power controller receives the output from filter 524 andadjusts the received low frequency signal by controlling the phase andpower of the signal output from RF phase and power controller 522. Thus,the signal output by RF phase and power controller 522 is a lowfrequency signal with the same frequency as the signal generated by thelow frequency generator, but with the desired phase difference andvoltage level. RF power amplifier 520 amplifies the signal received byRF phase and power controller 522, and the signal is then fed to the topelectrode through the matching network 504.

Therefore, the chamber of FIG. 5B includes top and bottom electrodespowered by the same low frequency RF power generator. However, the lowfrequency signals for the top and bottom electrodes have a desired phasedifference, and the voltage of the signals is also independent. In oneembodiment, the voltage of the signal at the bottom electrode is biggerthan signal at the top electrode, although other ratios between the twosignals are possible.

FIGS. 6A-6E illustrate the operation of the etching chamber at differenttimes in the RF power cycle, according to one embodiment. Embodiments ofthe invention provide a flux of both positive and negative ions to thesurface of the wafer surface for etching. FIGS. 6A-6D illustrate theprocess for etching with negative ions, and FIG. 6E illustrates etchingwith positive ions. It should be noted that FIGS. 6A-6E show the lowfrequency signals generated at the top and bottom electrode. The highfrequency signals have been omitted for ease of description.

In one embodiment, a low RF frequency is applied to the top electrodewith phase lock to the signal at the bottom electrode, such that thenegative ions born at the top sheath travel through the plasma bulk andapproach the surface of wafer when the bottom wafer sheath potential isat its minimum, or near its minimum. It is referred to herein as a phaselock between the signals at the top and bottom electrode, when the RFsignals powering the top and bottom electrodes have a desired phasedifference. Thus, the phase lock does not necessarily mean that bothsignals have the same phase, only that the phase difference between thetwo signals is predetermined and constant when operating the chamber.

Embodiments of the invention produce a flux of negative ions, having abroad energy distribution, which are delivered to the surface of thewafer without having to extinguish the plasma, as is the case in pulsedplasma chambers. The ion transit time is the time required by a negativeion to cross the plasma 612 and bottom sheath 616, i.e., the timerequired by the negative ion born at the top sheath to reach the bottomelectrode. The goal is to have the negative ions reach the bottom sheathwhen the bottom sheath is at the lowest RF potential. FIG. 6A shows achamber with independent RF power supplies in the top and bottomelectrodes. The phases of the RF power signals is controlled, such thatthe negative ions are created at the top electrode 604 when the topelectrode is at the maximum potential 606, and the negative ions reachthe substrate 620 when the bottom electrode potential 622 is at aminimum. It is noted that the boundary 608 of the top sheath changes asthe potential of the top sheath 606 changes, and the boundary of thebottom sheath 616 changes as the potential of the bottom sheath 614changes.

Wafer 618 has a top layer 620 where the etching is taking place. The toplayer 620 includes a mask layer on top of the layer that contains thefeatures to be etched. For example, contact holes 624 are the areas thatdo not have mask material and where the etching is desired.

Time difference 602 shows the time required for the negative ions to gofrom the top sheath to the bottom sheath. In one embodiment, thedistance d 610 between the top electrode and wafer 620 is used tocalculate the traveling time for the negative ions, as an approximationfor the distance between the top sheath and the bottom sheath. Inanother embodiment, the distance used to calculate the traveling time isthe distance between the top sheath when the top electrode is at themaximum potential and the bottom sheath when the bottom sheath is at thelowest potential. See below for a description with reference to FIG. 8,detailing the calculation of the travel time for the negative ions fromthe top sheath to the bottom sheath.

As the negative ions are accelerated onto the surface of the wafer, someof the negative ions will enter contact holes 624 in the top surface ofthe wafer 620 to perform the etching. The negative ions penetrate intothe contact holes and neutralize any positive charge accumulated at thebottom of the contact holes.

FIG. 6B shows the chamber at a time t₁ when the potential 606 of the topelectrode is at a maximum 632 VTS_(t1). At this time t₁, the voltageVBS_(t1) 634 of the bottom electrode has not reached its minimum yet.The negative ions 630 are being born at the top of the sheath and starttraveling through the plasma 612 towards the bottom sheath. It is notedthat the negative ions are not just present at the top of the sheath, asthere is always some density of negative ions throughout the plasma 612.However, for simplicity of description, a high level of negative ions isshown being born at the top of the sheath when the potential at the topof the sheath is at its maximum.

FIG. 6C shows the chamber a later time t₂ following t₁, where thenegative ions 630, that were born at the top sheath in t₁, are nowtraveling through the plasma 612 towards the bottom sheath. As thenegative ions travel through the sheath, the negative ions areaccelerated, and when the negative ions reach the bottom sheath theyhave enough energy to escape the plasma and reach the surface of thewafer.

At time t₂, the voltage of the top sheath 606 has a value of VTS_(t2)636, which is less than the maximum voltage at the top sheath. Thevoltage of the bottom sheath 614 has a value VBS_(t2) 638 that isapproaching the minimum voltage but that hasn't reached the minimum yet.

FIG. 6D shows the chamber at time t₃, with the negative ions arrive atthe bottom of the plasma when the potential of the bottom sheath is atits minimum. At time t₃, the voltage VBS_(t3) 642 is the minimum voltageof the bottom sheath 614. Some of the negative ions reaching the bottomsheath will escape the plasma, and either impact the top surface of thewafer 630 a, or enter some of the contact holes 630 b in the top surfaceof the wafer. Due to the layer of mask material on the top of the wafer,the effect of the negative ions reaching the mask material is less thanthe effect of the negative ions that enter the contact holes, resultingin the etching of the desired features in the wafer.

FIG. 6E shows the effect of positive ions in the etching of thesubstrate. At time t₄, the voltage of the bottom electrode 614 is at itsmaximum VBS_(t4) 652. As with the negative ions, some of the positiveions 654 will enter the contact holes, while other positive ions 656will reach the mask material on the top of the substrate 620.

As shown in FIGS. 6A-6E, there is etching in the chamber by bothpositive ions and negative ions. Also, there may be some accumulation ofpositive ions at the bottom of the contact holes. When the negative ionsreach the contact holes, there is a possible reaction with the positiveions that increases the etching effect. Also, by neutralizing thepositive charge accumulated on the wall of contact hole, undesiredeffects, such as slowing of the etch rate with larger hole depth ortwisting of the etch profile, are reduced.

FIG. 7 show measurements of the wafer sheath potential in a dualfrequency chamber, according to one embodiment. Several measurementswere taken in a plasma chamber, when different RF signals are fed to thechamber. When a high-frequency RF signal is introduced in the chambersimultaneously with the low-frequency RF signal, the voltage on thebottom sheath is slightly different from the ideal case previouslydescribed with reference to FIGS. 6A-6E. Three different measurementswere taken in the chamber. The first measurement 706 was taken with a 3kW 2 MHz RF power applied at the bottom electrode, without anyhigh-frequency RF power in the chamber. The voltage of the bottomsheath, shows a valley around the minimum voltage for the signal that isapproximately that of a symmetrical RF signal.

The second measurement 704 was taken with a 3 kW 2 MHz RF power sourceand a 400 W 27MHz RF power source. The introduction of the highfrequency RF shows that the low-frequency component of the bottom RFsignal presents some deformation due to the presence of thehigh-frequency RF signal. The shape of the voltage at the bottom doesnot appear as low as in the case where no high-frequency RF power isapplied.

The third measurement 702 was taken with a 3 kW 2 MHz RF power sourceand a 1200 W 27MHz RF power source. As the power of the high frequencyis increased, the deformation of the low-frequency component of thebottom RF signal increases. Therefore, the waveform is lifted when thesheath collapses to the water potential due to the high frequencycomponent of the RF signal.

Nevertheless, even though the minimum for the potential at the bottomsheath is not as low as in the case when only the high-frequency ispresent, the negative ion flux to the wafer is still possible. In oneembodiment, the phase difference between the top and bottom RF isadjusted based on the shape of the potential of the bottom sheath whenthe high-frequency RF is present. For example, in signal 702, theminimum of the sheath potential occurs before the minimum potential forthe signal generated by the RF power source. In this case, the phasedifference is adjusted so the negative ions arrive at the bottom sheathwhen the potential is lowest, and not when the potential of only thelow-frequency RF is at its lowest value.

FIG. 8 shows a flowchart illustrating an algorithm for adjusting thephase of the top-electrode RF signal in relation to the phase of thebottom-electrode RF signal. The travel time for the negative ions on thesheath is a function of several factors, including the gap d between theelectrodes, the upper sheath voltage V, the mass m of the negative ion,the pressure in the chamber, etc.

In the case of a fluorine negative ion F, the mass m_(f) of the negativeion is 19×1.67×10⁻²⁷ kg. Furthermore, the charge e of the electron takenpositively is 1.6×10⁻¹⁹ C. The relationship between the charge e of theelectron, the velocity v, the mass m_(f), and the voltage V isdetermined according to the following formula:

${eV} = \frac{m_{f}v^{2}}{2}$

Therefore, the velocity v can be expressed as follows:

$v = \sqrt{\frac{2{eV}}{m_{f}}}$

Therefore, for a sheath voltage V of 100 Volts, the velocity of thenegative ion is:

$v = {\sqrt{\frac{2 \times 1.6 \times 10^{- 9} \times 100}{19 \times 1.67 \times 10^{- 27}}} = {3.2 \times 10^{4}\mspace{14mu} {m/s}}}$

If the gap d between electrodes is 32 mm, the travel time t iscalculated as follows:

$t = {\frac{d}{v} = {\frac{0.032}{32000} = {1\mspace{14mu} \mu \; \sec}}}$

Therefore, the phase of the low frequency RF signal in the topelectrodes is controlled such that, the maximum voltage for the RFfrequency on the top electrode occurs a time t (1 μsec in this example)seconds ahead of the time corresponding to the minimum voltage for theRF frequency on the bottom electrode.

The negative ions traveling across the electrode gap experience multiplecollisions with neutral and charged particles present in the plasma. Ifthe sheath phase delay conditions discussed above are met, the negativeion flux delivered to the bottom electrode can be estimated as:

$\Gamma_{b} = {{\Gamma_{t}(0)}{\exp \left( {- \frac{d}{\lambda}} \right)}}$

where Γ_(t) is the negative ion flux born at the upper electrode, d isthe electrode spacing, and λ is the negative ion mean free path. Sincenegative ions experience collisions with both charged and neutral gasspecies, the mean free path is a complex function of the neutral gasdensity, the density of positive and negative ions, and the crosssections for ion-neutral and ion-ion collisions. The cross sections forion-ion collisions are significantly larger than the collisions withneutrals. However, in typical capacitive plasma chambers with low degreeof ionization, the neutral gas density dominates. As follows from theformula, it is advantageous to use smaller electrode gaps to maximizethe negative ion flux to the wafer since the flux decays exponentiallywith the distance.

Referring back to FIG. 8, a method is presented for adjusting the phaseof the top-electrode RF signal in relation to the phase of thebottom-electrode RF signal. In operation 802, the parameters of thechamber are set. Such parameters include the voltage of the RF signals,the distance between the top and bottom electrode, the pressure on thechamber, the phase difference between the low-frequency RF signals forthe top and bottom electrodes, etc. From operation 802, the methodcontinues to operation 804, where the travel time for the negative ionsis determined As discussed above, the travel time is determined based onthe different parameters of the chamber, such as the mass of thenegative ion, the distance for the negative ion to travel to cross theplasma, etc.

Once the travel time is established, in operation 806 the methoddetermines the phase of the bottom electrode RF power signal. Afteroperation 806, the method continues to operation 808, where the phase ofthe top electrode RF power signal is set based on the travel time, andon the phase of the bottom electrode RF power signal. In one embodiment,an iterative method is utilized to further refine the value of the phasedifference. After an initial setting is determined for the phasedifference, measurements are taken on the chamber regarding etchingperformance, such as concentration of negative ions in the plasma,concentration of positive ions in the plasma, feature quality, etc. Theresults with the performance measurements are then compared, and thevalue of the phase difference that produces the best etching results isselected.

It is noted that the embodiment illustrated in FIG. 8 is exemplary.Other embodiments may utilize different adjustments to synchronize thephases of the low frequency RF power signals, or control the phase ofthe bottom electrode signal based on the phase of the top electrodesignal, etc. The embodiments illustrated in FIG. 8 should therefore notbe interpreted to be exclusive or limiting, but rather exemplary orillustrative.

FIG. 9 shows a flowchart illustrating an algorithm for negative ioncontrol in a capacitively-coupled plasma chamber, in accordance with oneembodiment of the invention. In operation 902, a bottom radio frequency(RF) signal with a first phase is applied to the bottom electrode in thechamber. In one embodiment, a second high-frequency RF signal is alsoapplied to the bottom electrode. See for example, the chambers presentedin FIGS. 4, 5A, and 5B.

From operation 902 the method flows to operation 904, where the firstphase of the bottom RF signal is measured. In one embodiment, the phaseof the bottom RF signal is provided to an RF phase controller, such asthe one in FIG. 4, by the bottom RF power source. In another embodiment,the RF phase controller examines the signal coming out of a matchingnetwork, which includes filtering the high frequency RF signal, todetermine the phase of the low frequency RF signal being generated forthe bottom electrode. In yet another embodiment, the phase of the RFsignal is communicated from the RF phase controller to the RF powersource, which then generates the bottom RF signal with the desiredphase.

Further, a top RF signal with the second phase is applied to the topelectrode in the chamber in operation 906. In one embodiment, the phaseof the top RF signal is controlled by the RF phase controller, whichprovides the value of the desired phase to the top RF signal generator.In another embodiment, such as the one presented in FIG. 5B, the bottomRF signal is processed to generate the top RF signal, and this way thesecond low-frequency RF generator is not needed in the chamber. The RFphase controller receives the bottom RF signal, and generates a top RFsignal with the desire phase difference. The RF power amplifier adjuststhe amplitude for the top RF signal if necessary. The first phase andthe second phase are tracked to maintain the time difference between themaximum of the top RF signal and the minimum of the bottom RF signal atapproximately a constant predetermined value. In one embodiment,tracking includes periodically measuring the phase of the bottom RFsignal. Every time the phase of the bottom RF signal is measured, thephase of the top RF signal is adjusted, if necessary.

In one embodiment, the time difference is base on the time required fornegative ions to travel from the top of the chamber to the bottom of thechamber. However, this time difference can be farther fine-tuned bymeasuring the performance of the chamber utilizing different timedifferences, and then selecting the time difference that provides thebest results. In yet another embodiment, a user selects, via a GraphicalUser Interface, the time difference for the top and bottom RF signals.

FIG. 10 is a simplified schematic diagram of a computer system forimplementing embodiments of the present invention. It should beappreciated that the methods described herein may be performed with adigital processing system, such as a conventional, general-purposecomputer system. Special purpose computers, which are designed orprogrammed to perform only one function, may be used in the alternative.The computer system includes a central processing unit (CPU) 1004, whichis coupled through bus 1010 to random access memory (RAM) 1028,read-only memory (ROM) 1012, and mass storage device 1014. Phase controlprogram 1008 resides in random access memory (RAM) 1028, but can alsoreside in mass storage 1014 or ROM 1012.

Mass storage device 1014 represents a persistent data storage devicesuch as a floppy disc drive or a fixed disc drive, which may be local orremote. Network interface 1030 provides connections via network 1032,allowing communications with other devices. It should be appreciatedthat CPU 1004 may be embodied in a general-purpose processor, a specialpurpose processor, or a specially programmed logic device. Input/Output(I/O) interface provides communication with different peripherals and isconnected with CPU 1004, RAM 1028, ROM 1012, and mass storage device1014, through bus 1010. Sample peripherals include display 1018,keyboard 1022, cursor control 1024, removable media device 1034, camera1040, etc.

Display 1018 is configured to display the user interfaces describedherein. Keyboard 1022, cursor control 1024, removable media device 1034,and other peripherals are coupled to I/O interface 1020 in order tocommunicate information in command selections to CPU 1004. It should beappreciated that data to and from external devices may be communicatedthrough I/O interface 1020. The invention can also be practiced indistributed computing environments where tasks are performed by remoteprocessing devices that are linked through a wire-based or wirelessnetwork.

Embodiments of the present invention may be practiced with variouscomputer system configurations including hand-held devices,microprocessor systems, microprocessor-based or programmable consumerelectronics, minicomputers, mainframe computers and the like. Theinvention can also be practiced in distributed computing environmentswhere tasks are performed by remote processing devices that are linkedthrough a network.

With the above embodiments in mind, it should be understood that theinvention can employ various computer-implemented operations involvingdata stored in computer systems. These operations are those requiringphysical manipulation of physical quantities. Any of the operationsdescribed herein that form part of the invention are useful machineoperations. The invention also relates to a device or an apparatus forperforming these operations. The apparatus may be specially constructedfor the required purpose, such as a special purpose computer. Whendefined as a special purpose computer, the computer can also performother processing, program execution or routines that are not part of thespecial purpose, while still being capable of operating for the specialpurpose. Alternatively, the operations may be processed by a generalpurpose computer selectively activated or configured by one or morecomputer programs stored in the computer memory, cache, or obtained overa network. When data is obtained over a network the data maybe processedby other computers on the network, e.g., a cloud of computing resources.

The embodiments of the present invention can also be defined as amachine that transforms data from one state to another state. Thetransformed data can be saved to storage and then manipulated by aprocessor. The processor thus transforms the data from one thing toanother. Still further, the methods can be processed by one or moremachines or processors that can be connected over a network. Eachmachine can transform data from one state or thing to another, and canalso process data, save data to storage, transmit data over a network,display the result, or communicate the result to another machine.

One or more embodiments of the present invention can also be fabricatedas computer readable code on a computer readable medium. The computerreadable medium is any data storage device that can store data, whichcan be thereafter be read by a computer system. Examples of the computerreadable medium include hard drives, network attached storage (NAS),read-only memory, random-access memory, CD-ROMs, CD-Rs, CD-RWs, magnetictapes and other optical and non-optical data storage devices. Thecomputer readable medium can include computer readable tangible mediumdistributed over a network-coupled computer system so that the computerreadable code is stored and executed in a distributed fashion.

Although the method operations were described in a specific order, itshould be understood that other housekeeping operations may be performedin between operations, or operations may be adjusted so that they occurat slightly different times, or may be distributed in a system whichallows the occurrence of the processing operations at various intervalsassociated with the processing, as long as the processing of the overlayoperations are performed in the desired way.

Although the foregoing invention has been described in some detail forpurposes of clarity of understanding, it will be apparent that certainchanges and modifications can be practiced within the scope of theappended claims. Accordingly, the present embodiments are to beconsidered as illustrative and not restrictive, and the invention is notto be limited to the details given herein, but may be modified withinthe scope and equivalents of the appended claims.

1. A capacitively-coupled plasma chamber, comprising: a bottom radiofrequency (RF) signal generator coupled to a bottom electrode, thebottom RF signal set at a first phase; a top RF signal generator coupledto a top electrode, the top RF signal set at a second phase; and an RFphase controller operable to receive the bottom RF signal and operableto set a value of the second phase, wherein the RF phase controller isoperable to track the second phase and the first phase to maintain atime difference between a maximum of the top RF signal and a minimum ofthe bottom RF signal at approximately a predetermined value.
 2. Thechamber of claim 1, wherein the predetermined value is based on a traveltime required for negative ions formed near a top plasma sheath of theplasma in the chamber to travel to a bottom plasma sheath of the plasma.3. The chamber of claim 2, wherein the negative ions are formed near thetop plasma sheath when the top RF signal has the maximum value.
 4. Thechamber of claim 2, wherein the negative ions arrive at the bottomplasma sheath when the bottom RF signal is approximately at the minimumvalue.
 5. The chamber of claim 1, wherein a frequency of the bottom RFsignal is equal to a frequency of the top RF signal.
 6. The chamber ofclaim 1, further including: a high frequency RF signal generator coupledto the bottom electrode, wherein the top RF signal and the low RF signalare low frequency RF signals.
 7. The chamber of claim 6, wherein thehigh frequency RF signal has a frequency of 27 MHz, and wherein the topsignal and the low RF signal have a frequency of 2 MHz.
 8. The chamberof claim 1, wherein the top signal and the low RF signal have afrequency between 0.2 MHz and 2 MHz.
 9. The chamber of claim 1, whereina wafer is disposed above the bottom electrode when the wafer is in thechamber for processing.
 10. A method for operating acapacitively-coupled plasma chamber, the method comprising: applying abottom radio frequency (RF) signal set at a first phase to a bottomelectrode in the chamber; measuring the first phase of the bottom RFsignal; and applying a top RF signal set at a second phase to a topelectrode in the chamber, wherein the first phase and the second phaseare tracked to maintain a time difference between a maximum of the topRF signal and a minimum of the bottom RF signal at approximately apredetermined value.
 11. The method as recited in claim 10, furtherincluding: calculating the predetermined value as a travel time requiredfor negative ions formed near a top plasma sheath of the plasma in thechamber to travel to a bottom plasma sheath of the plasma.
 12. Themethod as recited in claim 11, wherein calculating the predeterminedvalue further includes: calculating a velocity of the negative ionstravelling in the plasma; and calculating the travel time as a distancebetween the top electrode and the bottom electrode divided by thevelocity of the negative ions.
 13. The method as recited in claim 10,wherein the bottom RF signal and the top RF signal have a frequency of400 KHz.
 14. The method as recited in claim 10, wherein methodoperations are performed by a computer program when executed by one ormore processors, the computer program being embedded in a non-transitorycomputer-readable storage medium.
 15. A capacitively-coupled plasmachamber, comprising: a bottom radio frequency (RF) signal generatorcoupled to a bottom electrode, the bottom RF signal set at a firstphase; and an RF phase controller operable to receive the bottom RFsignal and operable to generate a top RF signal set at a second phasefor a top electrode, wherein the RF phase controller is operable totrack the first phase and the second phase to maintain a time differencebetween a maximum of the top RF signal and a minimum of the bottom RFsignal at a predetermined value.
 16. The chamber of claim 15, whereinthe predetermined value is based on a travel time required for negativeions formed near a top plasma sheath of the plasma in the chamber totravel to a bottom plasma sheath of the plasma.
 17. The chamber of claim16, wherein the bottom RF signal and the top RF signal have a frequencyof 1 MHz.
 18. The chamber of claim 15, wherein the chamber is operableto perform etching with positive ions and negative ions.
 19. The chamberof claim 18, wherein the chamber is operable to generate positive ionswhen the bottom RF signal has an approximate maximum value.
 20. Thechamber of claim 15, wherein a distance between the top electrode andthe bottom electrode is between 15 mm and 100 mm